Sas_analyzer software for small-angle X-ray scattering data treatment


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详细

New approaches to the analysis of small-angle X-ray scattering data from nanoscale systems based on the optimization and direct multiple shooting methods are presented. A program is developed, which bears on these new approaches and allows a user to model small-angle X-ray diffraction data, introduce collimation corrections, and analyze dispersions in the samples. The program results for a number of typical nanosized systems (sols, catalysts) are reported and the comparison with currently available programs for small-angle data processing is presented.

作者简介

S. Poluyanov

Boreskov Institute of Catalysis, Siberian Branch

Email: ylarichev@gmail.com
俄罗斯联邦, Novosibirsk

F. Tuzikov

Boreskov Institute of Catalysis, Siberian Branch

Email: ylarichev@gmail.com
俄罗斯联邦, Novosibirsk

Yu. Larichev

Boreskov Institute of Catalysis, Siberian Branch; Novosibirsk National Research State University

编辑信件的主要联系方式.
Email: ylarichev@gmail.com
俄罗斯联邦, Novosibirsk; Novosibirsk

S. Tsybulya

Boreskov Institute of Catalysis, Siberian Branch; Novosibirsk National Research State University

Email: ylarichev@gmail.com
俄罗斯联邦, Novosibirsk; Novosibirsk

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