Fractional Quantum Hall Effect in SiGe/Si/SiGe Quantum Wells in Weak Quantizing Magnetic Fields


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

We have experimentally studied the fractional quantum Hall effect in SiGe/Si/SiGe quantum wells in relatively weak magnetic fields, where the Coulomb interaction between electrons exceeds the cyclotron splitting by a factor of a few XX. Minima of the longitudinal resistance have been observed corresponding to the quantum Hall effect of composite fermions with quantum numbers p = 1, 2, 3, and 4. Minima with p = 3 disappear in magnetic fields below 7 T, which may be a consequence of the intersection or even merging of the quantum levels of the composite fermions with different orientations of the pseudo-spin, i.e., those belonging to different valleys. We have also observed minima of the longitudinal resistance at filling factors ν = 4/5 and 4/11, which may be due to the formation of the second generation of the composite fermions.

Авторлар туралы

V. Dolgopolov

Institute of Solid State Physics

Email: shashkin@issp.ac.ru
Ресей, Chernogolovka, Moscow region, 142432

M. Melnikov

Institute of Solid State Physics

Email: shashkin@issp.ac.ru
Ресей, Chernogolovka, Moscow region, 142432

A. Shashkin

Institute of Solid State Physics

Хат алмасуға жауапты Автор.
Email: shashkin@issp.ac.ru
Ресей, Chernogolovka, Moscow region, 142432

S.-H. Huang

Department of Electrical Engineering and Graduate Institute of Electronics Engineering; National Nano Device Laboratories

Email: shashkin@issp.ac.ru
Қытай республикасы, Taipei, 106; Hsinchu, 300

C. Liu

Department of Electrical Engineering and Graduate Institute of Electronics Engineering; National Nano Device Laboratories

Email: shashkin@issp.ac.ru
Қытай республикасы, Taipei, 106; Hsinchu, 300

S. Kravchenko

Physics Department

Email: shashkin@issp.ac.ru
АҚШ, Boston, MA, 02115

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML

© Pleiades Publishing, Inc., 2018