Email this article A Technique for Measuring the Resistance of an Electrical Breakdown Channel in Thin Dielectric Films
- Authors: Pakhotin V.A.1, Sudar N.T.2
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Affiliations:
- Ioffe Institute, Russian Academy of Sciences
- Peter the Great St. Petersburg Polytechnic University
- Issue: Vol 62, No 3 (2019)
- Pages: 329-336
- Section: Electronics and Radio Engineering
- URL: https://journals.rcsi.science/0020-4412/article/view/160705
- DOI: https://doi.org/10.1134/S0020441219020222
- ID: 160705
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Abstract
A technique for measuring the rate of change in the breakdown-channel resistance and estimating the true amplitude and duration of the breakdown current was developed. This technique is based on the dependence of the amplitude and frequency of oscillations of the measured current on the channel resistance. The resistance of the breakdown channel and the breakdown current in a polymer dielectric film were determined.
About the authors
V. A. Pakhotin
Ioffe Institute, Russian Academy of Sciences
Author for correspondence.
Email: v.pakhotin@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
N. T. Sudar
Peter the Great St. Petersburg Polytechnic University
Author for correspondence.
Email: sudar53@mail.ru
Russian Federation, St. Petersburg, 195251
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