Effect of the Brij 30 porogen on the properties of sol–gel derived thin polymethylsilsesquioxane films
- Авторлар: Nenashev R.N.1, Kotova N.M.1, Vishnevskii A.S.1, Vorotilov K.A.1
-
Мекемелер:
- Moscow Technological University (MIREA)
- Шығарылым: Том 52, № 9 (2016)
- Беттер: 968-972
- Бөлім: Article
- URL: https://journals.rcsi.science/0020-1685/article/view/157918
- DOI: https://doi.org/10.1134/S0020168516090120
- ID: 157918
Дәйексөз келтіру
Аннотация
Thin polymethylsilsesquioxane films with Brij 30 porogen concentrations in the range ωsurf = 15.5–52.5 wt % have been produced by a sol–gel process. Their dielectric permittivity, refractive index, relative porosity, and shrinkage have been measured as functions of heat treatment temperature and porogen concentration.
Негізгі сөздер
Авторлар туралы
R. Nenashev
Moscow Technological University (MIREA)
Хат алмасуға жауапты Автор.
Email: nenashev@mirea.ru
Ресей, pr. Vernadskogo 78, Moscow, 119454
N. Kotova
Moscow Technological University (MIREA)
Email: nenashev@mirea.ru
Ресей, pr. Vernadskogo 78, Moscow, 119454
A. Vishnevskii
Moscow Technological University (MIREA)
Email: nenashev@mirea.ru
Ресей, pr. Vernadskogo 78, Moscow, 119454
K. Vorotilov
Moscow Technological University (MIREA)
Email: nenashev@mirea.ru
Ресей, pr. Vernadskogo 78, Moscow, 119454
Қосымша файлдар
