Electrical properties of semiconductor CdS studied by adsorption spectroscopy
- Autores: Rizakhanov M.A.1, Magomedov M.A.1, Kurbanova A.M.1
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Afiliações:
- Dagestan State Medical Academy
- Edição: Volume 53, Nº 1 (2017)
- Páginas: 35-38
- Seção: Article
- URL: https://journals.rcsi.science/0020-1685/article/view/158148
- DOI: https://doi.org/10.1134/S0020168517010137
- ID: 158148
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Resumo
The electrical conductivity of semiconductor CdS films (d ≤ 1 μm) having (0001)S and (0001)Cd polar faces has been measured as a function of temperature at different degrees of adsorption of O2, NO2, and N2O molecules. Adsorption spectroscopy has been used to identify bulk and surface electronic centers in a series of states with a wide range of ionization energies: Et = 0.14–2.21 eV. In contrast to the bulk centers, which have a quasi-continuous energy spectrum characteristic of CdS, the surface adsorption electronic centers have a discrete energy spectrum. The ionization energy of the electronic centers of adsorption origin in CdS + O2, CdS + NO2, and CdS + N2O structures has been measured for the first time at both polarities of the CdS faces and has been shown to depend on the chemistry of the adsorbate and the polarity of the film face.
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Sobre autores
M. Rizakhanov
Dagestan State Medical Academy
Email: a_kurb@mail.ru
Rússia, pl. Lenina 1, Dagestan, Makhachkala, 367000
M. Magomedov
Dagestan State Medical Academy
Email: a_kurb@mail.ru
Rússia, pl. Lenina 1, Dagestan, Makhachkala, 367000
A. Kurbanova
Dagestan State Medical Academy
Autor responsável pela correspondência
Email: a_kurb@mail.ru
Rússia, pl. Lenina 1, Dagestan, Makhachkala, 367000
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