Probe Current Sources for Electrical Impedance Tomography


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Several circuit designs and hardware implementations of probe current sources for broadband electrical impedance measurements were compared. The basic parameters of the circuits were studied by numerical methods. Various hardware implementations were experimentally tested. Printed circuit board topologies providing parameters close to those obtained by model estimation were suggested.

作者简介

K. Brazovskii

Siberian State Medical University; Tomsk National Research Polytechnic University

编辑信件的主要联系方式.
Email: bks@mt-tomsk.ru
俄罗斯联邦, Tomsk; Tomsk

J. Pekker

Siberian State Medical University; Tomsk National Research Polytechnic University

Email: bks@mt-tomsk.ru
俄罗斯联邦, Tomsk; Tomsk

A. Soldatov

Tomsk National Research Polytechnic University

Email: bks@mt-tomsk.ru
俄罗斯联邦, Tomsk

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