Photosensitivity of pSi-n(Si2)1–xy(Ge2)x(ZnSe)y heterostructures with quantum dots


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The spectral dependences of photosensitivity of pSi-n(Si2)1–xy(Ge2)x(ZnSe)y heterostructures and structural features of epitaxial film of (Si2)1–xy(Ge2)x(ZnSe)y solid solution were studied by atomic force microscopy. The peaks of sensitivity at photon energies of 1.60, 1.85, 2.40, and 2.54 eV due to ZnSe and Ge quantum dots in the solid solution layer were revealed.

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A. Saidov

Physics–Sun Scientific and Production Association, Institute of Physics and Technology

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Email: amin@uzsci.uz
乌兹别克斯坦, Tashkent, 100084

Sh. Usmonov

Physics–Sun Scientific and Production Association, Institute of Physics and Technology

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Email: kvant@mail.ru
乌兹别克斯坦, Tashkent, 100084

K. Amonov

Physics–Sun Scientific and Production Association, Institute of Physics and Technology

Email: kvant@mail.ru
乌兹别克斯坦, Tashkent, 100084

M. Saidov

Physics–Sun Scientific and Production Association, Institute of Physics and Technology

Email: kvant@mail.ru
乌兹别克斯坦, Tashkent, 100084

B. Kutlimuratov

Islam Karimov State Technical University

Email: kvant@mail.ru
乌兹别克斯坦, Tashkent, 100095

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