Device for Characterization of the Diffraction Pattern of Computer-Generated Holograms in a Wide Angular Range

Abstract

Results of the development and testing of a device for detecting and analyzing the diffraction pattern of computer-generated holograms are reported. It is demonstrated that this device allows characterization of the diffraction pattern of radiation reflected from the surface microrelief of the considered element or transmitted through it in the angular range of diffraction of the order of ±90° and 360° in terms of the azimuthal angle. A possibility of determining the periods, duty cycle, and angular orientation of diffraction structures and also the diffraction efficiency of all diffraction orders of the examined element is described. The device is designed for real-time monitoring of the microrelief depth and shape of computer-generated holograms in the course of their fabrication.