Optoelectronics, Instrumentation and Data Processing
ISSN 8756-6990 (Print)
ISSN 1934-7944 (Online)
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Keywords
Fourier optics
Raman scattering
computer simulation
diffraction efficiency
diffractive optical element
diffusion
digital holography
dimensional inspection
hyperspectral images
image processing
image reconstruction
laser writing
light diffraction
mathematical model
maximum likelihood method
nanomaterials
perturbation functions
remote sensing
scanning speed
silicon
terahertz radiation
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Keywords
Fourier optics
Raman scattering
computer simulation
diffraction efficiency
diffractive optical element
diffusion
digital holography
dimensional inspection
hyperspectral images
image processing
image reconstruction
laser writing
light diffraction
mathematical model
maximum likelihood method
nanomaterials
perturbation functions
remote sensing
scanning speed
silicon
terahertz radiation
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Author Details
Author Details
Latyshev, A. V.
Issue
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Title
File
Vol 52, No 3 (2016)
Physical and Engineering Fundamentals of Microelectronics and Optoelectronics
Nucleation of two-dimensional Si islands near a monatomic step on an atomically clean Si(111)-(7×7) surface
Vol 52, No 5 (2016)
Nanotechnologies in Optics and Electronics
Adatom concentration distribution on an extrawide Si(111) terrace during sublimation
Vol 52, No 5 (2016)
Nanotechnologies in Optics and Electronics
Introscopy in nano- and mesoscopic physics: Single electronics and quantum ballistics
Vol 54, No 2 (2018)
Physical and Engineering Fundamentals of Microelectronics and Optoelectronics
Spectroscopy of Single AlInAs Quantum Dots
Vol 55, No 5 (2019)
Physical and Engineering Fundamentals of Microelectronics and Optoelectronics
Silicon p-n-Diode Based Electro-Optic Modulators
Vol 55, No 5 (2019)
Nanotechnologies in Optics and Electronics
Photon-Assisted Electron Transmission through a Quantum Point Contact
Vol 55, No 5 (2019)
Nanotechnologies in Optics and Electronics
Plasmon-Enhanced Near-Field Optical Spectroscopy of Multicomponent Semiconductor Nanostructures
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