Investigations of an Optoelectronic Device for Angular Displacements Measurements with Use of a Deep Phasetype Reflective Grating

Мұқаба

Дәйексөз келтіру

Толық мәтін

Аннотация

An optoelectronic device for measurements of small angular displacements based on a diffraction of a laser beam on a deep reflective phasetype grating was suggested and investigated. The grating's depth is about several wavelengths. The zero diffraction order's power dependency on the incident angle of a laser beam was investigated theoretically and experimentally. There were found conditions when linear conversion of angular vibrations into changes of power of zero order took place. The experimentally measured sensitivity of the device was rad with channel bandwidth of 800 Hz and signal-to-noise ratio 10.

Авторлар туралы

V Komotskii

Peoples' Friendship University of Russia

Кафедра радиофизики; Российский университет дружбы народов; Peoples' Friendship University of Russia

Yu Sokolov

Peoples' Friendship University of Russia

Кафедра радиофизики; Российский университет дружбы народов; Peoples' Friendship University of Russia

A Alexeev

Peoples' Friendship University of Russia

Кафедра радиофизики; Российский университет дружбы народов; Peoples' Friendship University of Russia

E Basisty

Peoples' Friendship University of Russia

Кафедра радиофизики; Российский университет дружбы народов; Peoples' Friendship University of Russia

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML