Calibration of the optical-electronic system based on infrared sensors
- Authors: Zuev S.M.1,2, Konstantinov I.Y.3
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Affiliations:
- MIREA – Russian Technological University
- The Central Scientific Research Automobile and Automotive Engines Institute “NAMI”
- MIREA - Russian Technological University
- Issue: No 3 (2025)
- Pages: 112-124
- Section: ELECTRONICS, MEASURING EQUIPMENT AND RADIO ENGINEERING
- URL: https://journals.rcsi.science/2072-3059/article/view/355058
- DOI: https://doi.org/10.21685/2072-3059-2025-3-8
- ID: 355058
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Abstract
Background. The object of the study is an optoelectronic system based on infrared (IR) sensors. The subject of the study is the calibration methodology of this system. The purpose of the work is to develop and present an adaptive calibration methodology that takes into account the influence of external factors (such as illumination and temperature) to improve the accuracy and reliability of measurements. Materials and methods. The research was carried out using mathematical modeling, in particular, the power approximation method and the least squares method. The system was modeled in MATLAB/Simulink and experimental studies were carried out in laboratory and field conditions. Data processing and system control were carried out using the Tiva C Series LaunchPad microcontroller. Results. The calibration method is presented, based on mathematical models describing the dependence of the output voltage of the IR sensors on the distance to the object. The analysis of the influence of external conditions is carried out. The correction factors are introduced and calculated, allowing the dynamic adaptation of the measuring system to the changing operating conditions. Conclusions. Analysis of the simulation results and experimental data showed that the proposed approach to adaptive calibration can significantly improve the accuracy and reliability of measurements. The developed methodology can be applied to improve the operation of autonomous navigation systems, medical sensor devices and industrial measuring systems.
About the authors
Sergey M. Zuev
MIREA – Russian Technological University; The Central Scientific Research Automobile and Automotive Engines Institute “NAMI”
Author for correspondence.
Email: sergei_zuev@mail.ru
Candidate of physical and mathematical sciences, associate professor, associate professor of the sub-department of optical-electronic devices and systems; head of the department for training of highly qualified personnel and additional professional education
(78 Vernadskogo avenue, Moscow, Russia);(2 Avtomotornaya street, Moscow, Russia)Ivan Yu. Konstantinov
MIREA - Russian Technological University
Email: indavanes@yandex.ru
Student
(78 Vernadskogo avenue, Moscow, Russia)References
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