RietveldToTensor: Program for Processing Powder X-Ray Diffraction Data under Variable Conditions
- Авторлар: Bubnova R.S.1, Firsova V.A.1, Volkov S.N.1, Filatov S.K.2
-
Мекемелер:
- Grebenshchikov Institute of Silicate Chemistry
- St. Petersburg State University
- Шығарылым: Том 44, № 1 (2018)
- Беттер: 33-40
- Бөлім: Article
- URL: https://journals.rcsi.science/1087-6596/article/view/216381
- DOI: https://doi.org/10.1134/S1087659618010054
- ID: 216381
Дәйексөз келтіру
Аннотация
The RietveldToTensor program is designed to study crystal lattice deformations using the Rietveld method from the X-ray powder diffraction data gathered under varying physical and chemical conditions. Using the program, it is possible to determine the tensor of thermal expansion, compressibility, or chemical deformations of the material. The program runs on the Microsoft Windows 7 and higher platforms.
Авторлар туралы
R. Bubnova
Grebenshchikov Institute of Silicate Chemistry
Хат алмасуға жауапты Автор.
Email: rimma_bubnova@mail.ru
Ресей, St. Petersburg, 199034
V. Firsova
Grebenshchikov Institute of Silicate Chemistry
Email: rimma_bubnova@mail.ru
Ресей, St. Petersburg, 199034
S. Volkov
Grebenshchikov Institute of Silicate Chemistry
Email: rimma_bubnova@mail.ru
Ресей, St. Petersburg, 199034
S. Filatov
St. Petersburg State University
Email: rimma_bubnova@mail.ru
Ресей, St. Petersburg, 199034
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