RietveldToTensor : Program for Processing Powder X-Ray Diffraction Data under Variable Conditions

R. S. Bubnova; V. A. Firsova; S. N. Volkov; S. K. Filatov

doi:10.1134/S1087659618010054

RietveldToTensor: Program for Processing Powder X-Ray Diffraction Data under Variable Conditions

作者: Bubnova R.S.¹, Firsova V.A.¹, Volkov S.N.¹, Filatov S.K.²
隶属关系:
1. Grebenshchikov Institute of Silicate Chemistry
2. St. Petersburg State University
期: 卷 44, 编号 1 (2018)
页面: 33-40
栏目: Article
URL: https://journals.rcsi.science/1087-6596/article/view/216381
DOI: https://doi.org/10.1134/S1087659618010054
ID: 216381

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详细

The RietveldToTensor program is designed to study crystal lattice deformations using the Rietveld method from the X-ray powder diffraction data gathered under varying physical and chemical conditions. Using the program, it is possible to determine the tensor of thermal expansion, compressibility, or chemical deformations of the material. The program runs on the Microsoft Windows 7 and higher platforms.