Influence of iron doping on morphological, structural and optical properties of zinc oxide thin films prepared by dip-coating method
- Авторлар: Zegadi C.1, Abderrahmane A.2, Chaumont D.3, Lacroute Y.3, Abdelkebir K.4, Hamzaoui S.1, Adnane M.1
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Мекемелер:
- Laboratory of Electron Microscopy and Materials Sciences
- Organization for Research Promotion, Research Promotion Center
- NanoForm–ICB
- Equipe Surfaces, Interfaces, Procédés (SIP), Centre des Matériaux P.M. FOURT
- Шығарылым: Том 52, № 4 (2016)
- Беттер: 362-369
- Бөлім: Article
- URL: https://journals.rcsi.science/1068-3755/article/view/229789
- DOI: https://doi.org/10.3103/S1068375516040128
- ID: 229789
Дәйексөз келтіру
Аннотация
Undoped zinc oxide and iron-doped zinc oxide thin films have been deposited by the sol-geldipcoating method. The Fe/Zn nominal volume ratio was 5% in the solution. The effects of Fe incorporation on morphological, structural, and optical properties of ZnO films were investigated. The scanning electron microscopy measurements showed that the surface morphology of the prepared thin films was affected by Fe doping. The X-ray diffraction patterns of the thin films showed that doped incorporation leads to substantial changes in the structural characteristics of ZnO thin films. The optical absorption measurements indicated a band gap in the range of 3.31 to 3.19 eV. The X-ray photoelectron spectroscopy demonstrated that Fe is incorporated in the ZnO matrix with 6.5 atomic percent (at %). The energy dispersive spectroscopy studies indicated the formation of ZnO with high efficiency.
Авторлар туралы
C. Zegadi
Laboratory of Electron Microscopy and Materials Sciences
Хат алмасуға жауапты Автор.
Email: chewkizegadi@gmail.com
Алжир, El-Mnaouer Oran
A. Abderrahmane
Organization for Research Promotion, Research Promotion Center
Email: chewkizegadi@gmail.com
Жапония, Tokyo
D. Chaumont
NanoForm–ICB
Email: chewkizegadi@gmail.com
Франция, Dijon
Y. Lacroute
NanoForm–ICB
Email: chewkizegadi@gmail.com
Франция, Dijon
K. Abdelkebir
Equipe Surfaces, Interfaces, Procédés (SIP), Centre des Matériaux P.M. FOURT
Email: chewkizegadi@gmail.com
Франция, Paris
S. Hamzaoui
Laboratory of Electron Microscopy and Materials Sciences
Email: chewkizegadi@gmail.com
Алжир, El-Mnaouer Oran
M. Adnane
Laboratory of Electron Microscopy and Materials Sciences
Email: chewkizegadi@gmail.com
Алжир, El-Mnaouer Oran
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