Author Details
Chasin, A.
Issue | Section | Title | File |
Vol 52, No 10 (2018) | Physics of Semiconductor Devices | Analysis of the Features of Hot-Carrier Degradation in FinFETs | |
Vol 52, No 13 (2018) | Physics of Semiconductor Devices | Impact of the Device Geometric Parameters on Hot-Carrier Degradation in FinFETs |