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<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" article-type="research-article" dtd-version="1.2" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">Semiconductors</journal-id><journal-title-group><journal-title xml:lang="en">Semiconductors</journal-title><trans-title-group xml:lang="ru"><trans-title>Semiconductors</trans-title></trans-title-group></journal-title-group><issn publication-format="print">1063-7826</issn><issn publication-format="electronic">1090-6479</issn><publisher><publisher-name xml:lang="en">Физико-технический институт им. А.Ф.Иоффе РАН</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="publisher-id">206763</article-id><article-id pub-id-type="doi">10.1134/S1063782619090124</article-id><article-categories><subj-group subj-group-type="toc-heading"><subject>Xxiii International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 11–14, 2019</subject></subj-group><subj-group subj-group-type="article-type"><subject>Research Article</subject></subj-group></article-categories><title-group><article-title xml:lang="en">Comparison of the Features of Electron Transport and Subterahertz Generation in Diodes Based on 6-, 18-, 70-, and 120-Period GaAs/AlAs Superlattices</article-title></title-group><contrib-group><contrib contrib-type="author"><name><surname>Obolenskaya</surname><given-names>E. S.</given-names></name><address><country country="RU">Russian Federation</country></address><email>bess009@mail.ru</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name><surname>Ivanov</surname><given-names>A. S.</given-names></name><address><country country="RU">Russian Federation</country></address><email>bess009@mail.ru</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name><surname>Pavelyev</surname><given-names>D. G.</given-names></name><address><country country="RU">Russian Federation</country></address><email>bess009@mail.ru</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name><surname>Kozlov</surname><given-names>V. A.</given-names></name><address><country country="RU">Russian Federation</country></address><email>bess009@mail.ru</email><xref ref-type="aff" rid="aff1"/><xref ref-type="aff" rid="aff2"/></contrib><contrib contrib-type="author"><name><surname>Vasilev</surname><given-names>A. P.</given-names></name><address><country country="RU">Russian Federation</country></address><email>bess009@mail.ru</email><xref ref-type="aff" rid="aff3"/><xref ref-type="aff" rid="aff4"/></contrib></contrib-group><aff id="aff1"><institution>Lobachevsky State University of Nizhny Novgorod</institution></aff><aff id="aff2"><institution>Institute for Physics of Microstructures, Russian Academy of Sciences</institution></aff><aff id="aff3"><institution>Research and Engineering Center for Submicron Heterostructures for Microelectronics</institution></aff><aff id="aff4"><institution>Ioffe Institute</institution></aff><pub-date date-type="pub" iso-8601-date="2019-09-01" publication-format="electronic"><day>01</day><month>09</month><year>2019</year></pub-date><volume>53</volume><issue>9</issue><fpage>1192</fpage><lpage>1197</lpage><history><date date-type="received" iso-8601-date="2023-12-23"><day>23</day><month>12</month><year>2023</year></date></history><permissions><copyright-statement xml:lang="en">Copyright ©; 2019, Pleiades Publishing, Ltd.</copyright-statement><copyright-year>2019</copyright-year><copyright-holder xml:lang="en">Pleiades Publishing, Ltd.</copyright-holder></permissions><self-uri xlink:href="https://journals.rcsi.science/1063-7826/article/view/206763">https://journals.rcsi.science/1063-7826/article/view/206763</self-uri><abstract xml:lang="en"><p><ext-link><!-- named anchor --></ext-link></p><p id="idm45257554077872">A comparison of the features of electron transport in diodes based on 6-, 18-, 30-, 70-, and 120-period GaAs/AlAs superlattices with a similar design is performed. However, the number of periods and diode areas are different. The values of the parasitic resistances of the near-contact diode regions are correlated, and the specific voltage drop across one superlattice period is determined for all special points in the current–voltage characteristics of the diodes. The mechanism of the appearance of stable current oscillations in diodes based on 6-, 18-, 30-, 70-, and 120-period GaAs/AlAs superlattices with a high doping level is investigated.</p></abstract><kwd-group xml:lang="en"><kwd>superlattices</kwd><kwd>electron transport</kwd><kwd>diodes</kwd><kwd>THz generation</kwd></kwd-group></article-meta></front><body></body><back><ref-list/></back></article>
