Measurements of the X-Ray Line Spectrum of a Micropinch Source by a High-Sensitive Track Detector
- Авторы: Dolgov A.1, Klyachin N.2, Prokhorovich D.1
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Учреждения:
- Dukhov All-Russia Research Institute of Automatics
- National Research Nuclear University “MEPhI”
- Выпуск: Том 45, № 7 (2019)
- Страницы: 650-656
- Раздел: Plasma Diagnostics
- URL: https://journals.rcsi.science/1063-780X/article/view/187189
- DOI: https://doi.org/10.1134/S1063780X19060035
- ID: 187189
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Аннотация
The efficiency of the diffusion chamber as a tool for diagnostics of pulsed high-temperature plasma in a single discharge is demonstrated. Creation of a diffusion chamber operating at a temperature exceeding the temperature of the ambient medium will make it possible to simplify the device design and operation. Based on the experimental data obtained with the help of the diffusion chamber by means of diffraction spectroscopy, a hypothesis is put forward on the advanced development of electron acceleration processes compared to the process of micropinch plasma decay caused by anomalous plasma heating.
Об авторах
A. Dolgov
Dukhov All-Russia Research Institute of Automatics
Email: NAKlyachin@mephi.ru
Россия, Moscow, 127055
N. Klyachin
National Research Nuclear University “MEPhI”
Автор, ответственный за переписку.
Email: NAKlyachin@mephi.ru
Россия, Moscow, 115409
D. Prokhorovich
Dukhov All-Russia Research Institute of Automatics
Email: NAKlyachin@mephi.ru
Россия, Moscow, 127055