Отправить статью по E-mail Development of methods for ultrasonic scanning of X-ray wavelength
- Авторы: Blagov A.E.1,2, Pisarevskii Y.V.1,2, Prosekov P.A.1,2, Targonskii A.V.1,2, Eliovich Y.A.1,2, Protsenko A.I.1,2, Koval’chuk M.V.1,2
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Учреждения:
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
- National Research Centre “Kurchatov Institute,”
- Выпуск: Том 62, № 6 (2017)
- Страницы: 831-836
- Раздел: Diffraction and Scattering of Ionizing Radiations
- URL: https://journals.rcsi.science/1063-7745/article/view/191402
- DOI: https://doi.org/10.1134/S1063774517060037
- ID: 191402
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Аннотация
The method for X-ray wavelength tuning using an adaptive element (a quartz monolithic resonator modulated by a standing longitudinal low-frequency ultrasonic wave) has been proposed and implemented. This method is characterized by high tuning accuracy and possibility of scanning X-ray beam parameters with a time resolution of up to 3 μs.
Об авторах
A. Blagov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute,”
Автор, ответственный за переписку.
Email: blagov_ae@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
Yu. Pisarevskii
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute,”
Email: blagov_ae@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
P. Prosekov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute,”
Email: blagov_ae@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
A. Targonskii
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute,”
Email: blagov_ae@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
Ya. Eliovich
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute,”
Email: blagov_ae@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
A. Protsenko
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute,”
Email: blagov_ae@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
M. Koval’chuk
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute,”
Email: blagov_ae@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
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