Electron microscopy methods in studies of cultural heritage sites
- Авторлар: Vasiliev A.1,2, Kovalchuk M.1,2, Yatsishina E.1
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Мекемелер:
- National Research Centre “Kurchatov Institute”
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
- Шығарылым: Том 61, № 6 (2016)
- Беттер: 873-885
- Бөлім: Reviews
- URL: https://journals.rcsi.science/1063-7745/article/view/190343
- DOI: https://doi.org/10.1134/S1063774516060183
- ID: 190343
Дәйексөз келтіру
Аннотация
The history of the development and application of scanning electron microscopy (SEM), transmission electron microscopy (TEM), and energy-dispersive X-ray microanalysis (EDXMA) in studies of cultural heritage sites is considered. In fact, investigations based on these methods began when electron microscopes became a commercial product. Currently, these methods, being developed and improved, help solve many historical enigmas. To date, electron microscopy combined with microanalysis makes it possible to investigate any object, from parchment and wooden articles to pigments, tools, and objects of art. Studies by these methods have revealed that some articles were made by ancient masters using ancient “nanotechnologies”; hence, their comprehensive analysis calls for the latest achievements in the corresponding instrumental methods and sample preparation techniques.
Авторлар туралы
A. Vasiliev
National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
Хат алмасуға жауапты Автор.
Email: a.vasiliev56@gmail.com
Ресей, Moscow, 123182; Moscow, 119333
M. Kovalchuk
National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
Email: a.vasiliev56@gmail.com
Ресей, Moscow, 123182; Moscow, 119333
E. Yatsishina
National Research Centre “Kurchatov Institute”
Email: a.vasiliev56@gmail.com
Ресей, Moscow, 123182