X-ray diffraction and X-ray standing-wave study of the lead stearate film structure
- Авторлар: Blagov A.1,2, Dyakova Y.1,2, Kovalchuk M.1,2, Kohn V.1,2, Marchenkova M.1,2, Pisarevskiy Y.1,2, Prosekov P.1,2
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Мекемелер:
- Shubnikov Institute of Crystallography
- National Research Centre “Kurchatov Institute”
- Шығарылым: Том 61, № 3 (2016)
- Беттер: 362-370
- Бөлім: Diffraction and Scattering of Ionizing Radiations
- URL: https://journals.rcsi.science/1063-7745/article/view/189960
- DOI: https://doi.org/10.1134/S1063774516030044
- ID: 189960
Дәйексөз келтіру
Аннотация
A new approach to the study of the structural quality of crystals is proposed. It is based on the use of X-ray standing-wave method without measuring secondary processes and considers the multiwave interaction of diffraction reflections corresponding to different harmonics of the same crystallographic reflection. A theory of multiwave X-ray diffraction is developed to calculate the rocking curves in the X-ray diffraction scheme under consideration for a long-period quasi-one-dimensional crystal. This phase-sensitive method is used to study the structure of a multilayer lead stearate film on a silicon substrate. Some specific structural features are revealed for the surface layer of the thin film, which are most likely due to the tilt of the upper layer molecules with respect to the external normal to the film surface.
Авторлар туралы
A. Blagov
Shubnikov Institute of Crystallography; National Research Centre “Kurchatov Institute”
Email: prosekov@crys.ras.ru
Ресей, Leninskii pr. 59, Moscow, 119333; pl. Akademika Kurchatova 1, Moscow, 123182
Yu. Dyakova
Shubnikov Institute of Crystallography; National Research Centre “Kurchatov Institute”
Email: prosekov@crys.ras.ru
Ресей, Leninskii pr. 59, Moscow, 119333; pl. Akademika Kurchatova 1, Moscow, 123182
M. Kovalchuk
Shubnikov Institute of Crystallography; National Research Centre “Kurchatov Institute”
Email: prosekov@crys.ras.ru
Ресей, Leninskii pr. 59, Moscow, 119333; pl. Akademika Kurchatova 1, Moscow, 123182
V. Kohn
Shubnikov Institute of Crystallography; National Research Centre “Kurchatov Institute”
Email: prosekov@crys.ras.ru
Ресей, Leninskii pr. 59, Moscow, 119333; pl. Akademika Kurchatova 1, Moscow, 123182
M. Marchenkova
Shubnikov Institute of Crystallography; National Research Centre “Kurchatov Institute”
Email: prosekov@crys.ras.ru
Ресей, Leninskii pr. 59, Moscow, 119333; pl. Akademika Kurchatova 1, Moscow, 123182
Yu. Pisarevskiy
Shubnikov Institute of Crystallography; National Research Centre “Kurchatov Institute”
Email: prosekov@crys.ras.ru
Ресей, Leninskii pr. 59, Moscow, 119333; pl. Akademika Kurchatova 1, Moscow, 123182
P. Prosekov
Shubnikov Institute of Crystallography; National Research Centre “Kurchatov Institute”
Хат алмасуға жауапты Автор.
Email: prosekov@crys.ras.ru
Ресей, Leninskii pr. 59, Moscow, 119333; pl. Akademika Kurchatova 1, Moscow, 123182