Accurate Refinement of the Crystal Structure of Ba3TaGa3Si2O14 from Langasite Family and Analysis of Structural Transformations Due to Isomorphous Cation Substitutions

Abstract

An accurate structure analysis of a Ba₃TaGa₃Si₂O₁₄ single crystal from langasite family was performed using four X-ray diffraction data sets collected on a diffractometer equipped with a CCD area detector (sp. gr. P321, Z = 1, sinθ/λ ≤ 1.35 Å^–1; at 295 K a = 8.516(1) Å, c = 5.1910(6) Å, R/wR = 0.58/0.56%, Δρ_min/Δρ_max =–0.73/0.42 e/ų, 4414 independent reflections; at 106 K a = 8.5109(9) Å, c = 5.1861(9) Å, R/wR = 0.75/0.86%, Δρ_min/Δρ_max =–0.81/1.06 e/ų, 4382 reflections). The distinguishing feature of the Ba₃TaGa₃Si₂O₁₄ structure is a strong disorder of the Ga atom at the 3f site. Structural transformations in the series of Сa₃TaGa₃Si₂O₁₄–Sr₃TaGa₃Si₂O₁₄–Ba₃TaGa₃Si₂O₁₄–Ba₃TaFe₃Si₂O₁₄ crystals were analyzed.