Detector for Selective Detection of Particles and Ions Based on an Epitaxial Layer of Synthetic Diamond

Abstract

A particle and ion detector based on an epitaxial layer of synthetic diamond is investigated. The p–i structure consists of a substrate comprised of HPHT p-type diamond, strongly doped with boron, on which ~10 μm thick, IIa-type, diamond CVD-film is deposited. Continuous contacts were deposited on the substrate and diamond CVD fi lm. The current-voltage characteristics of the p–i structure with deposited platinum contacts were measured. The detector was tested in fluxes of protons, deuterons, and α-particles obtained by means of an ion accelerator. The use of a diamond detector as a particle analyzer is promising in view of its unique properties, such as high radiation resistance and the possibility of operating at high temperature. The energy resolution of the detector and the minimum detectable particle energy were determined.