X-Ray diffraction line profile analysis of the microstructure of micro- and nanosized alumina particles

Аннотация

X-ray diffraction line profile analysis is adapted to investigate the microstructure of alumina. The structure of electrocorundum and corundum powders produced from pseudoboehmite with submicronic and nanometer-sized particles is analyzed. The lognormal size distribution parameters and their dependence on the conditions of corundum synthesis are determined. The structure of dislocations in corundum with different synthesis prehistories is analyzed, and structural features of the studied material are revealed.