Email this article Jumping-mode atomic force microscopy in studying the electromechanical properties of soft samples
- Authors: Kalinin A.S.1,2, Atepalikhin V.V.1, Leesment S.I.1, Polyakov V.V.1
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Affiliations:
- NT-MDT Spectrum Instruments, Zelenograd
- Moscow Institute of Physics and Technology (State University)
- Issue: Vol 81, No 12 (2017)
- Pages: 1516-1520
- Section: Article
- URL: https://journals.rcsi.science/1062-8738/article/view/185265
- DOI: https://doi.org/10.3103/S1062873817120085
- ID: 185265
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Abstract
A new approach is proposed for the nondestructive piezoresponse measuring of soft, loose, and fragile nanostructures with simultaneous characterization of their mechanical properties. The new mode is based on HybriD mode atomic force microscopy (fast force–distance curve measurements with real-time processing of the obtained data). The piezoelectric and mechanical properties of diphenylalanine peptide tubes with diameters of less than 100 nm are measured for the first time.
About the authors
A. S. Kalinin
NT-MDT Spectrum Instruments, Zelenograd; Moscow Institute of Physics and Technology (State University)
Author for correspondence.
Email: akalinin@ntmdt-si.com
Russian Federation, Moscow, 124460; Dolgoprudny, Moscow oblast, 141701
V. V. Atepalikhin
NT-MDT Spectrum Instruments, Zelenograd
Email: akalinin@ntmdt-si.com
Russian Federation, Moscow, 124460
S. I. Leesment
NT-MDT Spectrum Instruments, Zelenograd
Email: akalinin@ntmdt-si.com
Russian Federation, Moscow, 124460
V. V. Polyakov
NT-MDT Spectrum Instruments, Zelenograd
Email: akalinin@ntmdt-si.com
Russian Federation, Moscow, 124460
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