作者的详细信息
Ksenich, S. V.
| 期 | 栏目 | 标题 | 文件 |
| 卷 80, 编号 12 (2016) | Proceedings of the XIX Russian Symposium “On Scanning Electron Microscopy and Analytical Methods of Investigation Used in Solid State Physics” | Investigation of silicon doped by zinc ions with a large dose |