An Automated Algorithm for Constructing Maps of Defects in Active Thermal Testing


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The algorithm makes it possible to simplify the procedure for processing results of the thermal testing aimed at both revealing latent defects and evaluating their transverse dimensions and shape. Applying this algorithm requires certain participation and experience of the thermography operator, as well as preliminary preparation of initial data by using techniques that increase the signal-to-noise ratio. The algorithm includes selection of defective zones on the thermogram of the test object, automated identification of points with extreme signals, and a pixel-by-pixel threshold analysis of the zones adjacent to these points, culminating in the construction of binary defect maps.

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A. Chulkov

Tomsk Polytechnic University

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Email: chulkovao@tpu.ru
俄罗斯联邦, Tomsk, 634028

D. Nesteruk

Tomsk Polytechnic University

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Email: nden@tpu.ru
俄罗斯联邦, Tomsk, 634028

V. Vavilov

Tomsk Polytechnic University

编辑信件的主要联系方式.
Email: vavilov@tpu.ru
俄罗斯联邦, Tomsk, 634028

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