An Automated Algorithm for Constructing Maps of Defects in Active Thermal Testing
- 作者: Chulkov A.O.1, Nesteruk D.A.1, Vavilov V.P.1
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隶属关系:
- Tomsk Polytechnic University
- 期: 卷 55, 编号 8 (2019)
- 页面: 617-621
- 栏目: Thermal Methods
- URL: https://journals.rcsi.science/1061-8309/article/view/181949
- DOI: https://doi.org/10.1134/S1061830919080035
- ID: 181949
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详细
The algorithm makes it possible to simplify the procedure for processing results of the thermal testing aimed at both revealing latent defects and evaluating their transverse dimensions and shape. Applying this algorithm requires certain participation and experience of the thermography operator, as well as preliminary preparation of initial data by using techniques that increase the signal-to-noise ratio. The algorithm includes selection of defective zones on the thermogram of the test object, automated identification of points with extreme signals, and a pixel-by-pixel threshold analysis of the zones adjacent to these points, culminating in the construction of binary defect maps.
作者简介
A. Chulkov
Tomsk Polytechnic University
编辑信件的主要联系方式.
Email: chulkovao@tpu.ru
俄罗斯联邦, Tomsk, 634028
D. Nesteruk
Tomsk Polytechnic University
编辑信件的主要联系方式.
Email: nden@tpu.ru
俄罗斯联邦, Tomsk, 634028
V. Vavilov
Tomsk Polytechnic University
编辑信件的主要联系方式.
Email: vavilov@tpu.ru
俄罗斯联邦, Tomsk, 634028
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