A Novel Method to Measure Sub-micro Repeatability of the High-Precision Positioning Control System Based on Digital Image Correlation Method


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

To measure and analyze the repeatability of the high-precision positioning control system, an optical technique based on Digital Image Correlation (DIC) method coupling with digital microscope is proposed. In this study, the reliability and feasibility of this method is verified in high-accuracy motorized linear platform, the repeatability of which is calibrated as ±0.3 μm. To determine the in-plane displacement, the DIC requires two speckles images during each hysteresis process to represent the displacement change of platform using digital microscope. In essence, the method can be considered as a “plane to plane” measurement, which can effectively reduce the random error compared to “point to point” measurements. In last, five groups of displacement data under different loadings were obtained and be used to testify the feasibility of this method. In summary, the present study provides a simple, low-cost and efficient non-contact optical technique to detect sub-micro repeatability.

Авторлар туралы

Yong Sang

School of Mechanical Engineering

Хат алмасуға жауапты Автор.
Email: sang110@163.com
ҚХР, Dalian, Liaoning, 11024

Jianlong Zhao

School of Mechanical Engineering

Email: sang110@163.com
ҚХР, Dalian, Liaoning, 11024

Haonan Xu

School of Mechanical Engineering

Email: sang110@163.com
ҚХР, Dalian, Liaoning, 11024

Pengpeng Wang

School of Mechanical Engineering

Email: sang110@163.com
ҚХР, Dalian, Liaoning, 11024

Lilai Shao

School of Mechanical Engineering

Email: sang110@163.com
ҚХР, Dalian, Liaoning, 11024

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML

© Pleiades Publishing, Ltd., 2018