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Study of multilayer carbon nanotubes subjected to the impact of a nanosecond high-energy ion beam
Bolotov V.V., Knyazev E.V., Sten’kin Y.A., Ivlev K.E.
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y.S., Borgardt N.I., Lazarenko P.I., Parsegova V.S., Prikhodko A.S., Sherchenkov A.A.
Investigation of the local characteristics of amorphous electrical steel
Virus A.A., Kaminskaya T.P., Stepovich M.A., Korovushkin V.V., Shipko M.N., Tikhonov A.I., Popov V.V.
Investigation of the surface of antifriction Al–Cu–Si–Sn–Pb aluminum alloys
Stolyarova O.O., Muravyeva T.I., Zagorskiy D.L., Gubenko M.M.
Modification of the Nanoglobular Structure of Glassy Carbon by Heat Treatment and Ion Irradiation
Andrianova N.N., Borisov A.M., Kazakov V.A., Makunin A.V., Mashkova E.S., Ovchinnikov M.A.
Electron and probe microscopy investigation of the surface of elastomers modified with antifriction fillers
Stolyarova O.O., Muravyeva T.I., Gainutdinov R.V., Morozov A.V., Zagorskiy D.L., Petrova N.N., Portnyagina V.V.
Studying the formation of a true-secondary-electron signal in the low-voltage SEM mode
Kazmiruk V.V., Kurganov I.G., Osipov N.N., Podkopaev A.A., Savitskaya T.N.
Effect of the Surface of Medical Titanium Endoprostheses on the Efficiency of Fibrointegration
Shaikhaliyev A.I., Polisan A.A., Ivanov S.Y., Parkhomenko Y.N., Malinkovich M.D., Yarygin K.N., Arazashvili L.D.
Study of the Microstructure, Crystallographic Structure and Thermal Stability of Al–Ti–Nb Alloys Produced by Selective Electron Beam Alloying
Valkov S., Neov D., Bezdushnyi R., Beskrovnyi A., Kozlenko D., Petrov P.
Investigation of secondary-emission signal formation in the low-voltage SEM mode
Kazmiruk V.V., Kurganov I.G., Osipov N.N., Podkopaev A.A., Savitskaya T.N.
Influence of the Substrate Type on the Surface Morphology of Cu2ZnSnSe4 Thin Films
Baraishuk S.M., Tkachenko T.M., Stanchik A.V., Gremenok V.F., Bashkirov S.A., Wiertel M., Budzynski M., Turovets A.I., Yakovenko Y.S.
Atоmiс Force Microscopy of Graphene-Like Films Deposited onto Preirradiated SiO2/Si
Sedlovets D.M., Knyazev M.A., Trofimov O.V.
Estimation of the SEM beam diameter by video-signal curves from a trapezoidal structure: 1. Simulation experiment
Larionov Y.V.
Modification of Zinc-Implanted Silicon by Swift Xenon Ion Irradiation
Privezentsev V.V., Skuratov V.A., Kulikauskas V.S., Makunin A.V., Ksenich S.V., Steinman E.A., Tereshchenko A.N., Goryachev A.V.
Scanning Probe Microscopy of Magnetorheological Elastomers
Valiev K.K., Minaev A.Y., Stepanov G.V., Karnet Y.N., Yumashev O.B.
Influence of annealing temperature and its atmosphere on the properties of zinc implanted silicon
Privezentsev V.V., Kulikauskas V.S., Zatekin V.V., Shcherbachev K.D., Tabachkova N.Y., Eidelman K.B., Ksenich S.V., Batrakov A.A.
HPHT single crystal diamond type IIB growth sector influence on the secondary electron emission phenomenon
Sadovoy V., Blank V., Teteruk D., Terentiev S., Kornilov N.
Comparative analysis of methods for measurement of the surface potential of dielectrics charging under electron-beam irradiation in a scanning electron microscope
Rau E.I., Tatarintsev A.A., Kupreenko S.Y., Zaitsev S.V., Podbutsky N.G.
Titanium-Carbide Formation in a Liquid Hydrocarbon Medium by Femtosecond Laser Irradiation
Kochuev D.A., Khorkov K.S., Abramov D.V., Arakelian S.M., Prokoshev V.G.
SEM identification of the amorphous state of Fe−B ribbons
Frolov A.M., Kraynova G.S., Dolzhikov S.V.
Investigation of the closed porosity of functional ceramic materials by spin-echo small-angle neutron scattering
Pavlov K.A., Velichko E.V., Zabenkin V.N., Kraan W.H., Duif C.P., Bouwman W.G., Mikhailovskaya Z.A., Buyanova E.S., Grigoriev S.V.
Effect of the substrate material on the structure of carbon nanomaterials upon synthesis in a plasma jet reactor
Shavelkina M.B., Amirov R.H., Vorobyeva N.A., Katarzhis V.A.
Synthesis of Rhenium-Silicide Microcrystals in a Tin Melt
Solomkin F.Y., Orekhov A.S., Sharenkova N.V., Khavrov G.D., Isachenko G.N., Zaitseva N.V., Klechkovskaya V.V.
High-resolution X-ray diffractometry and transmission electron microscopy as applied to the structural study of InAlAs/InGaAs/InAlAs multilayer transistor nanoheterostructures
Galiev G.B., Klimov E.A., Imamov R.M., Ganin G.V., Pushkarev S.S., Maltsev P.P., Zhigalina O.M., Orekhov A.S., Vasil’ev A.L., Presniakov M.Y., Trunkin I.N.
Microstructural Effects in Electron-Microscopic Studies of Carbonate Rocks
Kuzmin V.A.
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