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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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G

Guk, S. V.
Gumarov, G. G.
Gundorin, N. A.
Gureev, A. I.
Gurin, V. S.
Gurov, V. S.
Guryeva, P. V.
Gusakova, O. V.
Gusev, A. I.
Gusev, E. E.
Gusev, N. S.
Gusev, S. A.
Guseynov, M. M.
Gushchin, M. S.
Gushchina, E. V.
Gutor, S. S.
Gutorov, K. M.
Gvozdyakov, D. V.

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