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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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V

Vishnyakova, E. A.
Vit’ko, V. V.
Vizgalov, I. V.
Vlasenko, V. G.
Vlasov, A. N.
Vlasov, V. P.
Vnukov, I. E.
Voinov, Yu. P.
Voitsekhovskii, A. V.
Vokhmyanina, K. A.
Volegov, A. S.
Volesky, L.
Volkov, N. V.
Volkov, R. L.
Volkova, G. K.
Volobuev, A. N.
Volobuev, I. V.
Volodin, V. N.
Volosova, M. A.
Volpian, O. D.
Vorob’ev, E. V.
Vorob’ev, V. L.
Vorob’ev, Ye. V.
Vorob’eva, N. V.
Vorobiev, S. V.

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