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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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G

Golikova, O. L.
Gololobov, G. P.
Goloshchapov, D. L.
Golovin, Yu. M.
Golovina, O. Yu.
Golovkova, E. A.
Golovkova, Ye. A.
Golubev, E. K.
Goncharov, A. A.
Goncharov, L. A.
Goponov, Yu. A.
Goray, L. I.
Gorbatchuk, V. V.
Gordeev, G. P.
Gordeliy, V. I.
Gorelik, V. S.
Gorev, R. V.
Gorin, K. V.
Gorlachev, E. S.
Gorodetsky, A. E.
Gorodzha, S. N.
Goroshko, M. A.
Gorshkov, A. N.
Gorshkov, O. N.
Gorshkova, Yu. E.

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