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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

V

Vasina, Ya. A.
Vaskovskiy, I. K.
Vaskovsky, I. K.
Vdovichev, S. N.
Vdovicheva, N. K.
Vdovin, V. F.
Vedeneev, A. S.
Veksler, I. V.
Velichko, A. A.
Velichko, E. V.
Veligzhanin, A. A.
Velikhanov, A. R.
Vergeles, P. S.
Verkhoglyadov, A. Ye.
Veselova, L. P.
Vetlitsyna-Novikova, K. S.
Vetoshkin, V. M.
Vilensky, A. I.
Vilkov, F. E.
Vilkov, I. V.
Vinogradov, A. V.
Vinogradov, E. A.
Vinokurov, Z. S.
Virus, A. A.
Vishnyakov, A. V.

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