Enviar artigo por via de e-mail Estimate of Errors in the Determination of Parameters of Linear Thermal Circuits of Semiconductor Devices Based on the Frequency Dependence of the Thermal Impedance
- Autores: Sergeev V.A.1, Frolov I.V.1
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Afiliações:
- Ulyanovskii Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences
- Edição: Volume 59, Nº 8 (2016)
- Páginas: 850-855
- Seção: Thermal Measurements
- URL: https://journals.rcsi.science/0543-1972/article/view/245461
- DOI: https://doi.org/10.1007/s11018-016-1056-4
- ID: 245461
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Resumo
We propose a method for determining the parameters of linear thermal circuits of semiconductor devices represented in the form of series-connected RC circuits. As a result of computer modeling, we obtain an estimate for errors in determining the indicated parameters based on the frequency dependence of the modulus of the thermal impedance.
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Sobre autores
V. Sergeev
Ulyanovskii Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences
Autor responsável pela correspondência
Email: ufire@mv.ru
Rússia, Ulyanovsk
I. Frolov
Ulyanovskii Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences
Email: ufire@mv.ru
Rússia, Ulyanovsk
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