On the applicability of Young–Laplace equation for nanoscale liquid drops
- Авторлар: Yan H.1,2, Wei J.3, Cui S.4, Xu S.5, Sun Z.5, Zhu R.2,5
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Мекемелер:
- Department of Electronic Information and Physics
- State Key Laboratory of Nonlinear Mechanics (LNM)
- Advanced Semiconductor Materials (ASM) Technology Singapore
- Department of Physics and Electronic Information
- Key Laboratory of Microgravity, Institute of Mechanics
- Шығарылым: Том 90, № 3 (2016)
- Беттер: 635-640
- Бөлім: Physical Chemistry of Nanoclusters and Nanomaterials
- URL: https://journals.rcsi.science/0036-0244/article/view/167925
- DOI: https://doi.org/10.1134/S0036024416030158
- ID: 167925
Дәйексөз келтіру
Аннотация
Debates continue on the applicability of the Young–Laplace equation for droplets, vapor bubbles and gas bubbles in nanoscale. It is more meaningful to find the error range of the Young–Laplace equation in nanoscale instead of making the judgement of its applicability. To do this, for seven liquid argon drops (containing 800, 1000, 1200, 1400, 1600, 1800, or 2000 particles, respectively) at T = 78 K we determined the radius of surface of tension Rs and the corresponding surface tension γs by molecular dynamics simulation based on the expressions of Rs and γs in terms of the pressure distribution for droplets. Compared with the two-phase pressure difference directly obtained by MD simulation, the results show that the absolute values of relative error of two-phase pressure difference given by the Young–Laplace equation are between 0.0008 and 0.027, and the surface tension of the argon droplet increases with increasing radius of surface of tension, which supports that the Tolman length of Lennard-Jones droplets is positive and that Lennard-Jones vapor bubbles is negative. Besides, the logic error in the deduction of the expressions of the radius and the surface tension of surface of tension, and in terms of the pressure distribution for liquid drops in a certain literature is corrected.
Авторлар туралы
Hong Yan
Department of Electronic Information and Physics; State Key Laboratory of Nonlinear Mechanics (LNM)
Email: zhurz@lnm.imech.ac.cn
ҚХР, Changzhi, 046011; Beijing, 100190
Jiuan Wei
Advanced Semiconductor Materials (ASM) Technology Singapore
Email: zhurz@lnm.imech.ac.cn
Сингапур, 2 Yishun Avenue 7, Singapore, 768924
Shuwen Cui
Department of Physics and Electronic Information
Email: zhurz@lnm.imech.ac.cn
ҚХР, Cangzhou, 061000
Shenghua Xu
Key Laboratory of Microgravity, Institute of Mechanics
Email: zhurz@lnm.imech.ac.cn
ҚХР, Beijing, 100190
Zhiwei Sun
Key Laboratory of Microgravity, Institute of Mechanics
Email: zhurz@lnm.imech.ac.cn
ҚХР, Beijing, 100190
Ruzeng Zhu
State Key Laboratory of Nonlinear Mechanics (LNM); Key Laboratory of Microgravity, Institute of Mechanics
Хат алмасуға жауапты Автор.
Email: zhurz@lnm.imech.ac.cn
ҚХР, Beijing, 100190; Beijing, 100190