Email this article Exact Analytical Solutions of the Problem of Electromagnetic-Wave Reflection from Dielectric Layers with New Types of Inhomogeneities
- Authors: Denisova N.A.1
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Affiliations:
- N. I. Lobachevsky State University of Nizhny Novgorod
- Issue: Vol 59, No 3 (2016)
- Pages: 234-245
- Section: Article
- URL: https://journals.rcsi.science/0033-8443/article/view/243683
- DOI: https://doi.org/10.1007/s11141-016-9692-8
- ID: 243683
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Abstract
We describe a method for finding new classes of monotonic and nonmonotonic profiles of the refractive index in inhomogeneous layers, which allow one to obtain exact analytical solutions of the direct problem of electromagnetic-field reflection. The possibility of using inhomogeneous layers for optical antireflection coating is discussed.
About the authors
N. A. Denisova
N. I. Lobachevsky State University of Nizhny Novgorod
Email: kocharovskiy@gmail.com
Russian Federation, Nizhny Novgorod
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