Near-Field Resonance Microwave Tomography and Holography
- Authors: Gaikovich K.P.1,2, Smirnov A.I.2,3, Yanin D.V.3
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Affiliations:
- Institute for Physics of Microstructures of the Russian Academy of Sciences
- N. I. Lobachevsky State University of Nizhny Novgorod
- Institute of Applied Physics of the Russian Academy of Sciences
- Issue: Vol 60, No 9 (2018)
- Pages: 733-749
- Section: Article
- URL: https://journals.rcsi.science/0033-8443/article/view/243833
- DOI: https://doi.org/10.1007/s11141-018-9842-2
- ID: 243833
Cite item
Abstract
We develop the methods of electromagnetic computer near-field microwave tomography of distributed subsurface inhomogeneities of complex dielectric permittivity and of holography (shape retrieval) of internally homogeneous subsurface objects. The methods are based on the solution of the near-field inverse scattering problem from measurements of the resonance-parameter variations of microwave probes above the medium surface. The capabilities of the proposed diagnostic technique are demonstrated in the numerical simulation for sensors with a cylindrical capacitor as a probe element, the edge capacitance of which is sensitive to subsurface inhomogeneities.
About the authors
K. P. Gaikovich
Institute for Physics of Microstructures of the Russian Academy of Sciences; N. I. Lobachevsky State University of Nizhny Novgorod
Author for correspondence.
Email: gaikovich@mail.ru
Russian Federation, Nizhny Novgorod; Nizhny Novgorod
A. I. Smirnov
N. I. Lobachevsky State University of Nizhny Novgorod; Institute of Applied Physics of the Russian Academy of Sciences
Email: gaikovich@mail.ru
Russian Federation, Nizhny Novgorod; Nizhny Novgorod
D. V. Yanin
Institute of Applied Physics of the Russian Academy of Sciences
Email: gaikovich@mail.ru
Russian Federation, Nizhny Novgorod
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