High quality ZnS/Au/ZnS transparent conductive tri-layer films deposited by pulsed laser deposition


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Resumo

ZnS/Au/ZnS tri-layer films were deposited on quartz glass substrates by pulsed laser deposition. The influence of Au layer thickness on optical and electrical properties of the tri-layer ZnS/Au/ZnS was studied. X-ray diffractometer (XRD) and scanning electron microscope were employed to characterize the crystalline structure and surface morphology of the tri-layer films. Hall measurements, ultraviolet and visible spectrophotometer, four-point probe were used to explore the optoelectronic properties of the ZnS/Au/ZnS. The increase of Au layer thickness resulted in the decreased resistivity, the increased carrier concentration, and the declined transmittance in the visible light region.

Sobre autores

Caifeng Wang

College of Physics and Engineering; Aeronautical Engineering College

Autor responsável pela correspondência
Email: cfwang_2004@163.com
República Popular da China, Qufu, 273165; Binzhou, 256603

Qingshan Li

College of Physics and Engineering; School of Physics and Optoelectronic Engineering

Email: cfwang_2004@163.com
República Popular da China, Qufu, 273165; Yantai, 264025

Jisuo Wang

College of Physics and Engineering

Email: cfwang_2004@163.com
República Popular da China, Qufu, 273165

Lichun Zhang

School of Physics and Optoelectronic Engineering

Email: cfwang_2004@163.com
República Popular da China, Yantai, 264025

Fengzhou Zhao

School of Physics and Optoelectronic Engineering

Email: cfwang_2004@163.com
República Popular da China, Yantai, 264025

Fangying Dong

School of Physics and Optoelectronic Engineering

Email: cfwang_2004@163.com
República Popular da China, Yantai, 264025

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