The use of the ratios of intensities of spectral lines for X-ray fluorescence analysis of metal alloys and oxide materials

Abstract

An X-ray fluorescence analysis technique is proposed, which is based on using ratios of intensities of spectral lines. The technique includes performing calculations for evaluation of calibration equations, which allows using few reference samples or carrying out standardless analysis, if necessary. That parameters of the calibration equations depend linearly on concentrations of disturbing elements allows one to simplify taking their influence into account. To apply the developed technique to analysis of samples containing a significant amount of undetectable light elements, a use of a dependence of intensity ratio of the characteristic radiation of the X-ray tube’s anode, coherently and incoherently scattered by a sample, on a total content of undetectable elements is proposed. The technique’s adequacy is demonstrated by analysis of standard steel samples, metal cuttings and iron-ore materials.