Study of the ZnSxSe1–x@Al2O3 nanostructures by X-ray diffraction and EXAFS spectroscopy
- Autores: Chukavin A.I.1, Valeev R.G.1, Zubavichus Y.V.2, Trigub A.L.1,2, Beltyukov A.N.1
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Afiliações:
- Institute of Physics and Technology, Ural Branch
- National Research Center “Kurchatov Institute”
- Edição: Volume 58, Nº 6 (2017)
- Páginas: 1236-1244
- Seção: Article
- URL: https://journals.rcsi.science/0022-4766/article/view/161594
- DOI: https://doi.org/10.1134/S0022476617060233
- ID: 161594
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Resumo
Nanocomposite systems based on ternary ZnSxSe1–x semiconductor compounds with different compositions (x = 0, 0.3, 0.5, 0.7, 1) in dielectric matrices of nanoporous anodic aluminium oxide (AAO) are synthesized by high vacuum thermal evaporation of a zinc sulfide and selenide powder mixture. The effect of the atomic concentration of solid solutions and the structural parameters of the AAO template matrix on the crystal structure of the synthesized nanocomposites and the local atomic environment of Zn and Se atoms is investigated.
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Sobre autores
A. Chukavin
Institute of Physics and Technology, Ural Branch
Autor responsável pela correspondência
Email: andrey_chukavin@mail.ru
Rússia, Izhevsk
R. Valeev
Institute of Physics and Technology, Ural Branch
Email: andrey_chukavin@mail.ru
Rússia, Izhevsk
Ya. Zubavichus
National Research Center “Kurchatov Institute”
Email: andrey_chukavin@mail.ru
Rússia, Moscow
A. Trigub
Institute of Physics and Technology, Ural Branch; National Research Center “Kurchatov Institute”
Email: andrey_chukavin@mail.ru
Rússia, Izhevsk; Moscow
A. Beltyukov
Institute of Physics and Technology, Ural Branch
Email: andrey_chukavin@mail.ru
Rússia, Izhevsk
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